This paper studies the fault propagation and the correctness rate calculation of combinatorial circuits. We rely on circuit partitioning and on a probabilistic approach close to a binomial distribution, assuming some simultaneous faults have a …
verfasst von:
Esther Goudet, Fabio Sureau, Paul Breuil, Luis Peña Treviño, Lirida Naviner, Jean-Marc Daveau, Philippe Roche
The present article proposes a novel method to reduce phase noise in a PLL based X-Band source consisting of oscillating and non-oscillating components for the use in Pulse Doppler radar. It also provides phase noise performance stabilization …
Approximate Computing (AxC) aims at optimizing the hardware resources in terms of area and power consumption at the cost of a reasonable degradation in computation accuracy. Several design exploration approaches and metrics have been proposed so …
verfasst von:
Alberto Bosio, Samuele Germiniani, Graziano Pravadelli, Marcello Traiola
A radiation-hardened-by-design (RHBD) current-starved-ring voltage-controlled oscillator (CSR-VCO) design is proposed based on the separation of gate input technique to mitigate single event effects (SEEs) for phase-locked loop (PLL) …
Integrated circuit (IC) testing presents complex problems that for large circuits are exceptionally difficult to solve by traditional computing techniques. To deal with unmanageable time complexity, engineers often rely on human “hunches" and …
verfasst von:
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
Software is playing a growing role in many safety-critical applications, and software systems dependability is a major concern. Predicting faulty modules of software before the testing phase is one method for enhancing software reliability. The …
As the central control component in aerospace products, SRAM-based FPGA finds extensive application in space. In its operational context, the space radiation environment introduces single event effect (SEE) and space electrostatic discharge effect …
verfasst von:
Rongxing Cao, Yan Liu, Yulong Cai, Bo Mei, Lin Zhao, Jiayu Tian, Shuai Cui, He Lv, Xianghua Zeng, Yuxiong Xue
A faulty Through Silicon Via (TSV) could spoil a 3D IC and cause hefty loss as the potentially expensive known-good-dies bonded together must be discarded. This work presents a Fault-tolerant TSV scheme to avoid such a disastrous situation. Our …
With feature size scaling down, the effect of single event transient (SET) on the reliability of circuits is necessary to be considered. The bipolar amplification effect plays a key role in the charge collection of SET of nano-meter FinFET …
Memristive devices have become promising candidates to complement the CMOS technology, due to their CMOS manufacturing process compatibility, zero standby power consumption, high scalability, as well as their capability to implement high-density …
verfasst von:
T. S. Copetti, M. Fieback, T. Gemmeke, S. Hamdioui, L. M. Bolzani Poehls
Ensuring the reliability of GPUs and their internal components is paramount, especially in safety-critical domains like autonomous machines and self-driving cars. These cutting-edge applications heavily rely on GPUs to implement complex algorithms …
verfasst von:
Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edwar J. Patiño Núñez, Robert Limas, Matteo Sonza Reorda
The recent expansion of the Internet of Things (IoT) owes a lot to the significant contribution of the 6LoWPAN protocol, which has been extensively employed in low-power and lossy networks. To facilitate communication in 6LoWPAN networks, the …